TM 11-5821-284-34
Test equipment
Performance
Step
control settings
Figure ref.
Test procedure
standard
2
Same as step 1.
Measure with ME-26B/U
+6. 2 Vdc. 5%
for +6. 2 Vdc at pin 5
of circuit board Al.
3
Same as step 1.
Measure with ME-26B/U
+13. 7 Vdc t5%
for + 13. 7 Vdc at
A1AR1-10.
4
Same as step 1.
Measure with Ml'-2biB/U
+5. 1 Vdc. -5%
for +5. 1 Vde at pin 8 of
circuit board A;
Figure 5-3. Test connections, receive/transmit logic and homing circuit tests.
Figure 5-4. Test connections, power supply test.
5-11.
Pulsing Circuit Test
a. Test Equipment.
(3) Power Supply.
b. Test Connections and Conditions. Connect equipment as shown in figure 3-2. Connect positive lead of 100
MV OUTPUT to FL1 and negative lead to FL5. Turn on the equipment and allow 5-minuite warmup before proceeding.
c. Procedure
Test equipment
Performance
Step
control settings
Figure ref.
Test procedure
standard
Fig. 56 6Q
1
AN/ARM-115:
Manually trip limit switch
METER FUNCTION: +0
and 5-10 (TP-1)
S1 and observe wave
shown in figure 6-4A.
to 500 mV.
form at A1AR1-9
MV ADJUST: Adjust
for +100 mV.
MANUAL TUNE:, OFF.
AN/USM-281 :Adjust
controls to observe
waveforms shown in
figures 64A and 6-4B.
Power Supply. Adjust for
+27. 5 Vdc.
2
Same as step 1 except
With limit switch S1 still
set AN/ARM-115
and 5-10 (TP-1)
tripped, observe wave-
shown In figure 64B.
METER FUNCTION to
form ;it 41 R1--9
-0 to 600 mV and adjust
for -100-mV output.
5-12.
Sequencing Circuit Test
a. Test Equipment.
(5) Amplifier, Power Boonton 230A.
5-5